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ASC International to Demonstrate SAKI AOI at SMTA International
MEDINA, MN ―
ASC International, a developer of world class 3D SPI and AOI systems, and SAKI Corporation, a market leader in the production of robotic-based automatic visual inspection and X-ray technologies, have entered into an agreement that will focus on sales and service of SAKI’s 2D & 3D AOI and X-ray product line in the North American market.
“A portfolio that contains the breadth of SAKI’s well known 2D AOI line, their exciting new 3D AOI platform, and their innovative high-speed, automatic 3D X-ray machines – coupled with our own 3D SPI and low-cost off-line AOI products – will provide our North American customers with an unprecedented number of choices for realizing their yield improvement strategies,” explained ASC International President Jon Arneson.
“Both SAKI and ASC are already preferred suppliers to many top US- and Canadian-based Multinational EMS companies, so it is a natural fit to join forces in the North American market,” Arneson continued. “ASC’s success is based on its 20-year history of taking care of our customers, and we look forward to building on our success by teaming with SAKI’s worldwide service.”
ASC International looks forward to demonstrating SAKI’s new Frontier II high-speed in-line AOI system, which can full scan a PCB 18 x 20" (460 x 500 mm) in 10 seconds. The demonstration will take place in booth #434 at SMTA International in Orlando, FL, at the Walt Disney World Dolphin and Swan Resort from October 16-17, 2012. In addition, ASC will exhibit its current 3D SPI and low-cost AOI systems.
ASC International helps electronics manufacturers worldwide improve production yields and profits through the utilization of their industry leading portfolio of Automated Optical Inspection (AOI) systems, 3D Solder Paste Inspection (SPI) systems, and Statistical Process Control (SPC) tools. ASC works closely with its customers to develop yield improvement strategies that work... guaranteed.
For more information about ASC International, visit the new Web site:
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