Save. Share. Connect.
Friday, July 29, 2016
VOLUME -22 NUMBER 12
Publication Date: 12/1/2007
Front Page News
People in the News
Electronic Mfg. Services
Electronic Mfg. Products
Special Feature: Test and Measurement
Product Preview: Electronics West / MDM
December 2007 Issue
Electronic Mfg. Products
Add Message Board
Digitaltest Intros Test System Upgrades
Lambda MTS300 test system.
Concord, CA — Digitaltest has introduced an upgrade for its MTS Lambda In-Circuit Tester; throughputs can now be doubled, by enabling two test heads to work in parallel. The system has been designed to address the key features demanded of modern
manufacturing test — flexibility, high fault coverage and easy programming. The MTS300 Lambda flexibility is guaranteed by its comprehensive range of test methods combined with a modular design. This modular design allows optimal configuration for current needs without compromising the possibilities of future expansion. Future changes to individual test methods, as well as to the configuration of test pins, can be easily made. The range of test techniques includes analog and digital in-circuit test capabilities, vectorless testing, functional test, boundary-scan (optional) and on-board programming. The system is said to be one of the fastest machines on the market, capable of making 1,000 measurements/sec for high volume applications.
Because of its non-multiplexed system structure, the MTS system family is able to emulate existing test programs and fixtures from other platforms such as Aeroflex (Marconi), GenRad (7x and 8x), Teradyne (18xx series), Agilent (HP3070), and Rohde & Schwarz. This ability to exchange programs and fixtures with other test manufacturers' systems effectively makes the MTS a "neutral platform", which can save both time and money for the user. the company is launching a new Software version without Visual Basic. It offers easy programming thanks to its new graphical tabular format allowing fast test program handling and simple navigation. The clearly structured GUI enables users with limited test software experience to use the system. With multiple views, single statements as well as complete component groups can be debugged together.
For more information, contact: Digitaltest, Inc., 5046 Commercial Circle, Suite C, Concord, CA 94520
925-603-8650 fax: 925-603-8651 Web:
© 2015 USTECH. All Rights Reserved. |
Contact Us: 610-783-6100 | email@example.com
powered by GIM