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Acculogic Intros IEEE1149.6 Support
Publication Date: 5/9/2009

Markham, ON, Canada — Acculogic Manufacturing Test Systems Division has introduced its latest release of ScanNavigator software that offers full support for IEEE1149.6, an extension to IEEE1149.1 standard. The software is a suite of powerful tools for boundary-scan testing and programming based on the original ...
Acculogic Intros Updated IEEE Support
Publication Date: 11/25/2009

Woburn, MA — Acculogic Manufacturing Test Systems Division has released the latest version of ScanNavigator software that offers full support for IEEE1149.6, an extension to IEEE1149.1 standard. ScanNavigator software comprises a suite of powerful tools for boundary-scan testing and programming based on ...
ACE Intros Automated Lead Tinning System
Publication Date: 7/23/2008

Spokane Valley, WA — ACE Production Technologies, Inc. has introduced the LTS200 Lead Tinning System, a programmable, automated machine that safely reconditions component leads for Hi-Rel and/or, RoHS applications. It can be used for conventional lead tinning for Hi-Rel applications, or for reconditioning ...
Advanced Test Equipment: RF/Microwave Field Monitor
Publication Date: 9/15/2009

San Diego, CA — Advanced Test Equipment Rentals is unveiling the new Amplifier Research FM7004 Field Monitor. The RF/Microwave Instrumentation instrument is a multipurpose broadband electric and magnetic field monitoring system capable of performing all measurement display and control functions for ...
Aeroflex Developing PXI Test Solution Phone Chips
Publication Date: 11/25/2009

Stevenage, UK — Aeroflex will deliver a non-signaling PXI solution customized for RF production line test of Infineon's second-generation ultra low-cost mobile phone platform. The solution, based on the Aeroflex PXI 3000 Series, will test Infineon's second-generation ultra low-cost chipset (X-GOLD ...
Agilent Intros Physical Layer Test System Option
Publication Date: 5/9/2009

Santa Clara, CA — Agilent Technologies Inc. has introduced a breakthrough advanced calibration option together with the release of its Physical Layer Test System (PLTS) version 5.0 software. This new option integrates a suite of wizards for automatic fixture removal, Thru-Reflect-Line calibration ...
Agilent: AOI System Can Inspect Paste
Publication Date: 4/28/2008

Santa Clara, CA — Agilent Technologies Inc. has introduced a new Automated Optical Inspection (AOI) platform that is fully qualified for all areas of surface mount technology line inspection, including post-, pre- and 2-D capabilities. Developed to tackle today's complex and shrinking assemblies.  Customers reportedly can easily integrate the Medalist sj5000 into production lines where the...
Anver: ESD-Safe Suction Cups
Publication Date: 11/25/2009

Hudson, MA — A full line of ESD-safe vacuum suction cups for EOAT (end of arm tooling) used in the assembly and manufacture of a wide range of electronic devices is available from Anver Corp.
The Nomastat ESD Vacuum Suction Cups have a 97 KΩ*cm @500V static dissipating value and are molded from a proprietary elastomer that can withstand up to 400°F. Designed for EOAT...
Ascentech: GEN3 Solder Paste Analyzer
Publication Date: 2/6/2010

Chester, CT — Ascentech LLC's SPA 1000 Solder Paste Analyzer tests to the recently-released SMART Group standard, SG PCT01, "Control of Solder Paste used in Electronic Assembly Process". The new analyzer provides, for the first time, a user-friendly test procedure that may be conducted in less than  1 hour, and is intended to help electronics assemblers determine the suitability of the solder paste prior to production. The tests show the actual useful life of the paste that will help to reduce waste and ...
Ascentech: Solder Paste Analyzer
Publication Date: 1/25/2008

Chester, CT — Ascentech, LLC, North American distributor for the GEN3 Systems Ltd. products, has added the ShareGen SPA 1000 Solder Paste Analyzer to its product lineup. The analyzer reportedly provides fast and accurate testing to help control and manage solder paste in the production process. It ...
Atlas: Highly Accelerated UV Testing
Publication Date: 6/8/2009

Chicago, IL — Atlas Material Testing Technology is introducing the latest technology for ultra-accelerated exposure testing. This new outdoor testing device can provide approximately 63 years of South Florida UV radiation exposure in a single year. The company developed this new solar concentrator technology ...
Automatic Measurements from RAM Optical
Publication Date: 3/26/2008

Rochester, NY — The StarLite GX, from RAM Optical Instrumentation, Inc. (RAM), is a compact non-contact measurement system with an unusual ergonomic design, motorized zoom optics, color camera, and ample 6 x 3 x 5-in. XYZ capacity. The instrument — built for precision measurement — is small ...
Benchtop Temp Forcing System from Thermonics
Publication Date: 9/24/2007

Sunnyvale, CA — Thermonics, Inc. has introduced the T-2650BV Precision Temperature Forcing System (PTFS) for electronic component testing. The system is a true portable benchtop unit, and offers the convenience of portability as well as the ability to operate in environments that may be too space ...
CAD-Based Hi-Res Coverage from phoenix|x-ray
Publication Date: 2/6/2010

Wunstorf, Germany — x|act technology from phoenix|x-ray is part of the company's product line of GE Sensing & Inspection Technologies, and provides simple and intuitive CAD-based µAXI with very high image magnification. The technology provides for fully automatic x-ray inspection (AXI) of PCB ...
CAMI Cable Tester Adds Spanish Text Option
Publication Date: 1/25/2008

Acton, MA — CAMI Research's CableEye PC-Based Cable and Harness Test System now ships with multi-language capability. When the program's language preference is changed from English to Spanish, screen labels, dialog boxes, advisory screens, and error messages appear in Spanish-language text to help ...
CheckSum Intros In-Circuit Tester
Publication Date: 5/11/2007

Arlington, WA — CheckSum has introduced a new in-circuit tester aimed at users of Agilent 3070-series testers who need to increase test capacity. The Analyst fcs Low-Cost In-Ci ...
Christopher Intros 3D Inspection Profiler
Publication Date: 5/11/2007

Santa Ana, CA — Christopher Associates has introduced its Machvision 3D Profiler for the inspection of laser via topography. One of the critical issues in High Density Intercon ...
Compliant Digital EMC/EMI Receiver from Advanced Test Equipment Rentals
Publication Date: 8/13/2009

San Diego, CA — Advanced Test Equipment Rentals now has exclusive availability for immediate rental of the PMM 9010/9060 CISPR 16-1-1 compliant 10Hz-to-6GHz EMI Receiver system. The receiver designed and manufactured by Narda STS S.r.l., formerly known as PMM, is the first fully digital receiver in the 10Hz ...
Dage Equips X-ray Inspection with 2.0 MegaPixel Imaging
Publication Date: 6/12/2007

Fremont, CA — Dage Precision Industries has equipped its XiDAT XD7600NT digital x-ray inspection system with a standard 2.0 mega pixel imaging system.
Dage Intros Large Board X-Ray Inspection System
Publication Date: 5/11/2007

Fremont, CA — Dage Precision Industries is introducing its newest development in x-ray inspection technology, the Dage XiDAT XD7800 large board format digital x-ray inspection ...

 

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