Friday, June 22, 2018
Publication Date: 09/1/2010
Archive >  September 2010 Issue >  Electronic Mfg. Products > 

XJTAG Supports Micron PCM Memory Chips
Test tools for new memory chips.
Cambridge, UK — XJTAG is the first to provide support for Micron Omneo Phase Change Memory (PCM).

PCM enables enhanced system performance, and is programmed in situ after the board is assembled. XJTAG, working with Micron, has developed a solution to program PCM at close to its maximum programming speed using its boundary scan system. It will allow customers to program PCM quickly on production lines or in development labs. This builds on XJTAG?s successful XJFlash solution for high-speed programming of Flash memories.

PCM is a new memory technology that combines the best attributes found in NOR, NAND and DRAM. Because it's a new technology, it is important to build a strong ecosystem of support to promote customer adoption.

The XJTAG boundary scan system is fast and easy to use for development or production, with features such as its high-level test-description language, graphical application, which helps engineers to visualize their circuits, and automated connectivity tests and DFT analysis. The company's innovative software calculates how to utilize the boundary scan chain to maximize test coverage and accelerate programming of devices such as memories and PLDs. Used in conjunction with the company's boundary scan debug, test and programming system, XJFlash can be used to program and verify PCM devices, provided there is an FPGA or CPU on the target board and this is connected to the JTAG chain correctly.

Contact: XJTAG, Dirac House, St. John's Innovation Centre, Cowley Road, Cambridge CB4 0WS UK +44 (0)1223 223007 fax: +44 (0)1223 223009 E-mail: Web:

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