Thursday, August 25, 2016
VOLUME -26 NUMBER 6
Publication Date: 06/1/2011
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ARCHIVE >  June 2011 Issue >  Special Features: Test and Measurement > 
Increased Probe Density with Guided Pin Fixturing


Although other test and inspection technologies such as automated optical inspection have tried to supplant it, in-circuit test (ICT), which has been around since the 1970s, still delivers the highest test coverage with the least diagnostic ambiguity at the least cost for circuit board ...

Improving Nano-Scale Imaging with Negative-Stiffness Isolators


Traditionally, bungee cords and high-performance air tables have been the vibration isolators most used for scanning probe microscopy (SPM) and near-field scanning optical microscopy (NSOM). The ubiquitous passive-system air tables, adequate until a decade ago, are now being seriously ...

Improving Inspection with Digital Microscopes


Visually inspecting parts can be both challenging and time-consuming, especially when using traditional optical microscopes. With a limited depth-of-field, an inability to save images exactly as they are seen, lack of measurement tools and difficulty in properly illuminating a target, inspecting ...

PC Board Product Assurance Testing


How can a user of Printed Circuit Boards know they received what they specified? Recently, a field failure called into question some of the traditional methods of ensuring product performance when the failure was traced back to a printed circuit board problem. During analysis of the product ...

Counterfeit Devices: An Ongoing Menace


About seven years ago an independent distributor asked us to examine some parts that he had purchased from an offshore source — in this case, mainland China. He was not sure that the parts were marked correctly. He asked we could determine if the parts were, in fact, correctly marked ...

 
 
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