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Publication Date: 07/1/2011
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MVP: Supra E AOI and Microelectronics Inspection
Supra-E AOI system.
Carlsbad, CA — Machine Vision Products (MVP) is demonstrating its latest Supra E and Microelectronics inspection capabilities. MVP has demonstrated a high degree of adaptability of its systems throughout the 18 years of service to the industry.

According to the company, the Supra E AOI provides customers with the best cost-to-performance ratio for any AOI system. Capable of inspecting 508 x 508mm boards, the system utilizes the company's latest ease-of-use software and includes options for automatic database generation from a variety of input sources without the need for 3rd party data translators.

As with all of its inline SMT focused AOI solutions, the Supra E comes standard with a true 10µ pixel resolution for inspection of components as small as 01005, with full solder inspection. In addition, MVP supports sub-pixel algorithms with proven performance in demanding metrology applications.

Programming for microelectronics inspection has gotten easier. With no CAD data input, MVP's new ease of use wizards allow for programming a wide variety of different BGA layouts in a matter of minutes. The BGA application allows for full AOI inspection of ball metrology, ball height, ball misplacement and presence, and substrate surface finish. The other inspection coverage including the DIE/Substrate alignment and surface inspection, the wire bonding inspection and epoxy inspection.

Contact: Machine Vision Products, Inc., 5940 Darwin Ct., Carlsbad, CA 92008 800-260-4687 or 760-438-1138 fax: 760-438-0660 E-mail: Web:

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