Sunday, June 24, 2018

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Geotest Intros PXI Semicon Test System

Irvine, CA — Geotest has introduced the TS-900, a new PXI-based test system for component, SoC and SiP test applications. Offering up to 512 channels of 100MHz each, with per-pin PMUs and an integrated receiver interface, the modular TS-900 includes a full-featured set of hardware and software capabilities  for digital and mixed-signal test applications.

The custom-designed test interface supports the use of PCB DUT (Device Under Test) boards — a proven and high-performance method for interfacing to the device under test. In addition, the receiver interface's pin

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